N. Mita, IMPROVING THE RELIABILITY OF SPACE-USE TRAVELING-WAVE TUBES AND CONFIRMING THE IMPROVEMENT, Electronics & communications in Japan. Part 2, Electronics, 78(8), 1995, pp. 100-105
This study establishes the design method for the high reliability for
the space-use traveling wave tube (TWT) and presents the verification
experiment of the high-reliability performance for the case of TWT to
be installed on CS-3, as an example. Based on the relation between the
cathode current density and the lifetime, which is derived from the d
egradation theory of the coated impregnated cathode, the convergence r
atio of the electron gun and the cathode current density are optimized
. A method is presented which realizes the long-life and highly reliab
le TWT, by the high-reliability design and the screening based on theo
ry. To verify the high-reliability design, the wear-out failure distri
bution is estimated by the accelerated temperature test; and the failu
re rate due to the random failure is estimated from the actual in-orbi
t data. As a result of analysis of this mixed Weibull distribution, it
is shown that the failure rate of 1000 fit, which is set as the desig
n goal, can be achieved for 7 years of planned working period. It is s
hown also that by employing the high-reliability design, the failure r
ate of 1000 fit or less can be achieved even if the working period of
10 years is defined.