TRANSMITTANCE OF A THIN SARAN FILM IN THE 45-584-A WAVELENGTH REGION

The transmittance of a free-standing Saran film, 4260 Angstrom thick, has been measured by means of synchrotron radiation in the 45-584-Angs trom wavelength region. The transmittance was calculated by means of t he elemental composition of the film material as determined by x-ray p hotoelectron spectroscopy and the optical constants as derived from at omic-scattering factors. The calculated transmittance agreed with the measured transmittance in the 45-150-Angstrom wavelength region. The c alculated transmittance was significantly lower than that measured for the wavelength range 150-340 Angstrom. This difference implies that m olecular effects that are not accounted for by atomic-scattering facto rs become increasingly important at the longer wavelengths. (C) 1995 O ptical Society of America