EFFICIENT SAMPLING FOR SURFACE MEASUREMENTS

Authors
WOO TC LIANG R HSIEH CC LEE NK
Citation
Tc. Woo et al., EFFICIENT SAMPLING FOR SURFACE MEASUREMENTS, Journal of manufacturing systems, 14(5), 1995, pp. 345-354
Citations number
NO
Categorie Soggetti
Engineering, Manufacturing","Operatione Research & Management Science","Engineering, Industrial
Journal title
Journal of manufacturing systems → ACNP
ISSN journal
02786125
Volume
14
Issue
5
Year of publication
1995
Pages
345 - 354
Database
ISI
SICI code
0278-6125(1995)14:5<345:ESFSM>2.0.ZU;2-S
Abstract
The sample size is directly proportional to the time taken during insp ection, while the error due to discretization relates to the quality o f the process. This paper investigates two deterministic sequences of numbers, as sample coordinates, by presenting their computations and t heir applications to metrology. Results show a dramatic improvement in both the number of and the error in measurements.