DEVELOPMENT OF COINCIDENCE TRANSMISSION ELECTRON-MICROSCOPE .1. COINCIDENCE IMAGE CONSTRUCTION SYSTEM

An image-construction system for a coincidence transmission electron m icroscope (coincidence TEM) was developed, The coincidence TEM based o n a coincidence measurement technique allows us to select specified el ectrons which penetrated through a sample by exciting a specified atom to generate the characteristic X-rays. This technique enables a coinc idence image to be constructed under the conditions; the less the prim ary beam current and the better the S/N. Preliminary result of the coi ncidence imaging of Ag films is reported.