THE METHOD OF SUCCESSIVE DESCENT FROM LOC AL MINIMA IN FITTING OF X-RAY REFLECTIVITY DATA

Authors
SAMOILENKO II FEIGIN LA SCHEDRIN BM
Citation
Ii. Samoilenko et al., THE METHOD OF SUCCESSIVE DESCENT FROM LOC AL MINIMA IN FITTING OF X-RAY REFLECTIVITY DATA, Kristallografia, 40(5), 1995, pp. 801-808
Citations number
10
Categorie Soggetti
Crystallography
Journal title
Kristallografia → ACNP
ISSN journal
00234761
Volume
40
Issue
5
Year of publication
1995
Pages
801 - 808
Database
ISI
SICI code
0023-4761(1995)40:5<801:TMOSDF>2.0.ZU;2-A