THE STUDY OF MICRODEFECTS IN GAAS SINGLE- CRYSTALS DOPED WITH SI BY X-RAY DIFFUSE-SCATTERING

Authors
SHCHERBACHEV KD BUBLIK VT DARICHEVA OE
Citation
Kd. Shcherbachev et al., THE STUDY OF MICRODEFECTS IN GAAS SINGLE- CRYSTALS DOPED WITH SI BY X-RAY DIFFUSE-SCATTERING, Kristallografia, 40(5), 1995, pp. 868-876
Citations number
20
Categorie Soggetti
Crystallography
Journal title
Kristallografia → ACNP
ISSN journal
00234761
Volume
40
Issue
5
Year of publication
1995
Pages
868 - 876
Database
ISI
SICI code
0023-4761(1995)40:5<868:TSOMIG>2.0.ZU;2-E