IN-SITU DEPOSITION AND XPS CHARACTERIZATION OF LITHIUM BASED SOLID GLASS ELECTROLYTE VANADIA INTERFACES - OBSERVATION OF LITHIUM MIGRATION

In situ X-ray Photoelectron Spectroscopy (XPS) was used to examine the interfaces formed by reactive sputter deposition of vanadia onto seve ral lithium based solid glass electrolytes. It has been found that lit hium migration to the vanadia/vacuum interface can occur during deposi tion and that the presence of lithium can influence the oxygen uptake during the reactive sputtering process. The lithium migration is drive n by an electric field present due to the plasma; it is shown that the migration can be influenced by the deposition conditions.