PHONON MODE STUDY OF SI NANOCRYSTALS USING MICRO-RAMAN SPECTROSCOPY

Citation
H. Xia et al., PHONON MODE STUDY OF SI NANOCRYSTALS USING MICRO-RAMAN SPECTROSCOPY, Journal of applied physics, 78(11), 1995, pp. 6705-6708
Citations number
22
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
11
Year of publication
1995
Pages
6705 - 6708
Database
ISI
SICI code
0021-8979(1995)78:11<6705:PMSOSN>2.0.ZU;2-#
Abstract
First-order Raman spectra of hydrogenated nanocrystalline silicon (nc: Si:H) films show unexpected features in their optical vibrational mode s for crystallites with sizes ranging from 2 to 6 nm. Two size-depende nt spectral regions, one with the stronger intensity peaking at 505-50 9 cm(-1) and another a shoulder-like band between 512 and 517 cm(-1), are clearly identified using a detailed line-shape analysis and the st rong phonon confinement model. The strong size dependence of the relat ive integrated intensities of the two bands suggests that the modifica tion of the vibrational spectra can be attributed to an effect induced by the atomic vibrations from the near-surface region of the nanocrys tals. (C) 1995 American Institute of Physics.