Bright-field image contrast of thermotropic cholesteric liquid crystal
line materials in the transmission electron microscope (TEM) is invest
igated. Possible sources of contrast for these systems are discussed i
n terms of their molecular anisotropy. A cholesteric side-chain liquid
crystalline compound was investigated with TEM, low voltage high reso
lution scanning electron microscopy (LVHRSEM), and atomic force micros
copy (AFM) to determine the origin of the strong contrast observed in
these systems using bright-field transmission electron microscopy. Ini
tial contrast of thin microtomed sections, as viewed with TEM low dose
techniques and an image intensifier, was much weaker than observed un
der normal viewing conditions. The periodic steady state contrast typi
cally observed for these materials is the result of beam damage. Furth
ermore, the surface of microtomed samples (parallel to the cholesteric
helical axis) is corrugated with a periodicity of 1/2 the pitch due t
o a preferred fracture path in the glassy cholesteric state. AFM profi
le analysis shows an average peak to valley height of approximately 20
-25 nm. AFM of free surfaces from aligned films also indicates a corru
gation with a periodicity equal to 1/2 the pitch with substantially sm
aller average corrugation depths. TEM indicates a series of + 1/2 and
- 1/2 disclination lines at the surface due to a rotation of the prefe
rred helix direction parallel to the surface, consistent with previous
ly reported models.