X-RAY-INVESTIGATIONS OF LANGMUIR-BLODGETT MULTILAYER FILMS OF SIDE-CHAIN LIQUID-CRYSTAL COPOLYMERS

X-ray reflectivity studies on Langmuir Blodgett multilayer films of si de-chain liquid crystal polymers are reported. The films have a high d egree of lamellar order. The layer periodicity is independent of the t ype of monolayer deposition, implying a reorientation of the side grou p mesogens following the deposition process. X-ray reflectivity from t hin films displays subsidiary maxima permitting a quantitative measure of the change in side-chain density between multilayer and monolayer. A unit cell density profile is calculated for thick films assuming a symmetric unit cell.