Optical profile testers allow a nondestroying and therefore exact meas
urement of the topography of paper. It is possible to calculate roughn
ess parameters according to DIN and to ISO from measured line profiles
. The profiles can also be evaluated by Fourier Analysis and Autocorre
lation Function. Roughness parameters from the optical profilometer Mi
crofocus of the company UBM are compared with roughness values obtaine
d by conventional roughness testers such as Bekk, Bendtsen, Parker-Pri
nt-Surf, Hommel tester and KL smoothness meter. A further method to ch
aracterize the surface is the frequency distribution of roughness vari
ations, which can be applied to line profiles as well as to surface pr
ofiles.