DEFECT SILICON-OXYGEN MOTIF IN SILICATES

Authors
BOKII GB
Citation
Gb. Bokii, DEFECT SILICON-OXYGEN MOTIF IN SILICATES, Kristallografia, 40(4), 1995, pp. 763-765
Citations number
7
Categorie Soggetti
Crystallography
Journal title
Kristallografia → ACNP
ISSN journal
00234761
Volume
40
Issue
4
Year of publication
1995
Pages
763 - 765
Database
ISI
SICI code
0023-4761(1995)40:4<763:DSMIS>2.0.ZU;2-K