INVESTIGATION OF C-60 SINGLE-CRYSTAL BY X-RAY-METHODS

C-60 Single crystals grown by a single-temperature-gradient technique were characterized by synchrotron radiation white beam x-ray topograph y and x-ray double crystal diffraction with Cu K-alpha 1 radiation on conventional x-ray source. The results show that the crystal is rather well crystallized, The x-ray topographies give an evidence of dendrit ic growth mechanism of C-60 Single crystal, and x-ray double crystal d iffraction rocking curve shows that there are mosaic structural defect s in the sample. A phase transition st 249+/-1.5% K from a simple cubi c to a face centered cubic structure is confirmed by in situ observati on of synchrotron radiation white beam x-ray topography with the tempe rature varing from 230 to 295 K.