DETERMINATION OF LOCAL-STRUCTURE USING X-RAY-EMISSION SPECTROSCOPY - HYDROGENATED A-SINX AND A-SIOX

Authors
SIMUNEK A WIECH G
Citation
A. Simunek et G. Wiech, DETERMINATION OF LOCAL-STRUCTURE USING X-RAY-EMISSION SPECTROSCOPY - HYDROGENATED A-SINX AND A-SIOX, Journal of non-crystalline solids, 193, 1995, pp. 161-164
Citations number
6
Categorie Soggetti
Material Science, Ceramics
Journal title
Journal of non-crystalline solids → ACNP
ISSN journal
00223093
Volume
193
Year of publication
1995
Pages
161 - 164
Database
ISI
SICI code
0022-3093(1995)193:<161:DOLUXS>2.0.ZU;2-H
Abstract
It is demonstrated that, by a detailed analysis of the X-ray emission bands for hydrogenated amorphous SiNx and SiOx alloy films, it is poss ible to distinguish between the local structure described by the rando m-bond and random-mixture models.