LOCALIZED VIBRATIONAL-STATES IN AMORPHOUS-SILICON

Citation
A. Chehaidar et al., LOCALIZED VIBRATIONAL-STATES IN AMORPHOUS-SILICON, Journal of non-crystalline solids, 193, 1995, pp. 238-242
Citations number
16
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
193
Year of publication
1995
Pages
238 - 242
Database
ISI
SICI code
0022-3093(1995)193:<238:LVIA>2.0.ZU;2-L
Abstract
Using a valence-force-field model as interatomic potential, vibrationa l eigenstates have bean computed in the harmonic approximation. The de nsity of vibrational states and their inverse participation ratio are compared for crystalline silicon, fully-coordinated amorphous silicon (a-Si) and a-Si with voids. Voids of various sizes and concentrations have been introduced into an a-Si structure that was generated with a vacancy model. The presence of voids increases the local strain in the a-Si network and causes substantial changes in the vibrational densit y of states. Localization occurs not only for high frequency modes but also for band edge states. At low frequencies, the deviation from a D ebye density of states is due to such localized extra modes depending on void size and concentration.