ELECTROCHEMICAL PREPARATION AND CHARACTERIZATION OF RUTHENIUM DISULFIDE FILMS

Citation
K. Gurunathan et al., ELECTROCHEMICAL PREPARATION AND CHARACTERIZATION OF RUTHENIUM DISULFIDE FILMS, Materials research bulletin, 30(12), 1995, pp. 1579-1582
Citations number
9
Categorie Soggetti
Material Science
Journal title
ISSN journal
00255408
Volume
30
Issue
12
Year of publication
1995
Pages
1579 - 1582
Database
ISI
SICI code
0025-5408(1995)30:12<1579:EPACOR>2.0.ZU;2-6
Abstract
This paper embodies the first report on the electrochemical deposition of RuS2 thin films. The as-deposited and heat-treated films (in argon atmosphere) were characterized by XRD, SEM and UV-VIS-NIR spectrophot ometry. The polycrystalline deposits of RuS2 obtained indicated a cubi c structure with a lattice constant of 5.685 Angstrom, an average grai n size around 3 mu m, and an absorption coefficient of 5 x 10(4) cm(-1 ). The optical band gap was found to be 1.48 eV.