We report the temperature dependence of Al0.46In0.54As photoluminescen
ce (PL) transition energies and Al0.46In0.54As/InP interface staggered
line-up luminescence (SLL) energy. The S shape appearing from 4 to 90
K on the energy versus temperature curves of these PL energies is due
to extrinsic recombinations. In particular, the S shape of the SLL en
ergy curve versus temperature is probably due to acceptor impurities l
ocalized in AllnAs, at the interface (on-edge impurities). The binding
energy of on-edge impurities is lower than its value in the bulk mate
rial. This explains why the S shape is less pronounced on the SLL than
on the AllnAs PL curve. The band offsets were determined by solving t
he Schrodinger-Poisson equation system with a self-consistent calculat
ion program. At 4.5 K, the conduction and valence band offsets of the
Al0.46In0.54As/InP interface were respectively 0.384 eV and 0.295 eV.
This is in agreement with the already reported value of 410 meV for th
e conduction band offset of the lattice-matched Al0.48In0.52As/InP het
erostructure. The temperature dependence of the conduction and valence
band offsets is shown to be important: respectively 35 meV and 23 meV
between 4.5 and 300 K. The Van Vechten-Malloy model (following a ther
modynamic approach) for the temperature dependence of the band offsets
is compared with our results. The comparison shows only a qualitative
agreement.