PHOTOLUMINESCENCE AND BAND OFFSETS OF ALINAS INP/

Citation
P. Abraham et al., PHOTOLUMINESCENCE AND BAND OFFSETS OF ALINAS INP/, Semiconductor science and technology, 10(12), 1995, pp. 1585-1594
Citations number
40
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
10
Issue
12
Year of publication
1995
Pages
1585 - 1594
Database
ISI
SICI code
0268-1242(1995)10:12<1585:PABOOA>2.0.ZU;2-D
Abstract
We report the temperature dependence of Al0.46In0.54As photoluminescen ce (PL) transition energies and Al0.46In0.54As/InP interface staggered line-up luminescence (SLL) energy. The S shape appearing from 4 to 90 K on the energy versus temperature curves of these PL energies is due to extrinsic recombinations. In particular, the S shape of the SLL en ergy curve versus temperature is probably due to acceptor impurities l ocalized in AllnAs, at the interface (on-edge impurities). The binding energy of on-edge impurities is lower than its value in the bulk mate rial. This explains why the S shape is less pronounced on the SLL than on the AllnAs PL curve. The band offsets were determined by solving t he Schrodinger-Poisson equation system with a self-consistent calculat ion program. At 4.5 K, the conduction and valence band offsets of the Al0.46In0.54As/InP interface were respectively 0.384 eV and 0.295 eV. This is in agreement with the already reported value of 410 meV for th e conduction band offset of the lattice-matched Al0.48In0.52As/InP het erostructure. The temperature dependence of the conduction and valence band offsets is shown to be important: respectively 35 meV and 23 meV between 4.5 and 300 K. The Van Vechten-Malloy model (following a ther modynamic approach) for the temperature dependence of the band offsets is compared with our results. The comparison shows only a qualitative agreement.