COST-EFFECTIVE GENERATION OF MINIMAL TEST SETS FOR STUCK-AT FAULTS INCOMBINATIONAL LOGIC-CIRCUITS

This paper presents new cost-effective heuristics for the generation o f minimal test sets, Both dynamic techniques, which are introduced int o the test generation process, and a static technique, which is applie d to already generated test sets, are used. The dynamic compaction tec hniques maximize the number of faults that a new test vector detects o ut of the yet-undetected Faults as well as out of the already-detected ones. Thus, they reduce the number of tests and allow tests generated earlier in the test generation process to be dropped. The static comp action technique replaces N test vectors by M < M test vectors, withou t loss of fault coverage, During test generation, we also fmd a lower hound on test set size. Experimental results demonstrate the effective ness of the proposed techniques.