NEST - A NONENUMERATIVE TEST-GENERATION METHOD FOR PATH DELAY FAULTS IN COMBINATIONAL-CIRCUITS

A test generation procedure for path delay faults is proposed that tar gets all path delay faults in the circuit-undertest. The procedure ove rcomes the difficulties in handling the exorbitant numbers of path del ay faults in practical circuits by using a nonenumerative method of co nsidering faults that never explicitly targets any specific path delay fault, Experimental results demonstrate the effectiveness of the meth od in deriving tests to detect very large numbers of path delay faults .