INVERSE-PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY OF RH THIN-FILMS ON CU(100)

Citation
Ab. Hayden et al., INVERSE-PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY OF RH THIN-FILMS ON CU(100), Journal of physics. Condensed matter, 7(49), 1995, pp. 9475-9484
Citations number
36
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09538984
Volume
7
Issue
49
Year of publication
1995
Pages
9475 - 9484
Database
ISI
SICI code
0953-8984(1995)7:49<9475:IAASOR>2.0.ZU;2-4
Abstract
The growth of Rh films on Cu(100) has been investigated using Auger el ectron spectroscopy and momentum- (k-) resolved inverse photoemission (KRIPES) with a view to probing the electronic structure of near-monol ayer films and any possible magnetic ordering within these films. A pr onounced change in the line-shape of the Rh M(4,5)VV Anger electron pe ak as a function of average layer thickness indicates significant d-ba nd narrowing in the films of monolayer or submonolayer thickness relat ive to thicker films. KRIPES data indicate that in films grown at room temperature the spectra are dominated by density-of-states effects im plying poor order, and showing the expected unoccupied d-band feature at the Fermi level. Annealing at 750-900 K leads to significant loss o f Rh into the substrate, and KRIPES spectra dominated by surface-local ized states showing significant dispersion in parallel momentum more c haracteristic of s-p-band features.