Ab. Hayden et al., INVERSE-PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY OF RH THIN-FILMS ON CU(100), Journal of physics. Condensed matter, 7(49), 1995, pp. 9475-9484
The growth of Rh films on Cu(100) has been investigated using Auger el
ectron spectroscopy and momentum- (k-) resolved inverse photoemission
(KRIPES) with a view to probing the electronic structure of near-monol
ayer films and any possible magnetic ordering within these films. A pr
onounced change in the line-shape of the Rh M(4,5)VV Anger electron pe
ak as a function of average layer thickness indicates significant d-ba
nd narrowing in the films of monolayer or submonolayer thickness relat
ive to thicker films. KRIPES data indicate that in films grown at room
temperature the spectra are dominated by density-of-states effects im
plying poor order, and showing the expected unoccupied d-band feature
at the Fermi level. Annealing at 750-900 K leads to significant loss o
f Rh into the substrate, and KRIPES spectra dominated by surface-local
ized states showing significant dispersion in parallel momentum more c
haracteristic of s-p-band features.