AUTOMATIC TEST-GENERATION FOR DIGITAL ELECTRONIC-CIRCUITS

Automatic test generators produce test vectors for a digital circuit, given a description of the circuit at the gate level. For small and te stable circuits, a high-quality test can be produced without modifying the circuit. For larger, harder-to-test circuits, the technique of pa rtial scan can provide excellent fault coverage with limited circuit m odification. Where test modification can not be tolerated, test-genera tion tools can help by providing a powerful testability diagnostic cap ability to assist the designer in writing tests by hand.