We have studied electron transport in inversion layers of high-mobilit
y Si(100) samples. At high electron concentrations and temperatures be
low 4.2 K, two series of Shubnikov-de Haas (SdH) oscillations have bee
n observed. The temperature damping of the second series oscillations
indicates that the second occupied subband belongs to the first energy
level of the fourfold-degenerate ladder 0'. Samples with two occupied
subbands exhibit a strong anomalous negative magnetoresistance, reach
ing approximate to 25% of a zero field value at B = 12 T. The decrease
of resistance is more pronounced for lower temperatures and higher el
ectron concentrations. We explain this behaviour by an increase of the
second subband mobility due to the freezing-out of the scattering of
0' electrons. Based on the measured periods of SdH oscillations, we co
nclude that the electrons are distributed inhomogeneously beneath the
sample gate.