N-type indium doped CdTe grown on n(+)-GaAs by molecular beam epitaxy
has been studied by the standard deep level transient spectroscopy and
the isothermal Laplace-transform deep level transient spectroscopy. I
t was found that the Cd/Te flux ratio strongly influences the deep lev
el transient spectroscopy results. The unusual temperature dependence
of the electron emission rate in films grown at nearly stoichiometric
conditions may point out that the observed defect is resonant with the
conduction band.