QUANTIFICATION OF IMPURITIES IN BRASS USING SECONDARY-ION MASS-SPECTROMETRY - A COMPARISON OF MATRIX EFFECTS FOR CSM(+) CLUSTERS AND M(+) IONS

Citation
A. Adriaens et al., QUANTIFICATION OF IMPURITIES IN BRASS USING SECONDARY-ION MASS-SPECTROMETRY - A COMPARISON OF MATRIX EFFECTS FOR CSM(+) CLUSTERS AND M(+) IONS, International journal of mass spectrometry and ion processes, 151(1), 1995, pp. 63-68
Citations number
10
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
ISSN journal
01681176
Volume
151
Issue
1
Year of publication
1995
Pages
63 - 68
Database
ISI
SICI code
0168-1176(1995)151:1<63:QOIIBU>2.0.ZU;2-9
Abstract
This study discusses the influence of matrix effects on relative sensi tivity factors in secondary ion mass spectrometry for a quantification study of major and impurity elements in standard brass reference mate rials. A comparison has been made between relative sensitivity factors , which are obtained through acquisition of CsM(+) clusters under cesi um bombardment and of M(+) ions under oxygen bombardment. The data of the present study suggest that the matrix effects have been reduced in the case of cesium clusters, but nevertheless remain significant. In addition, the reproducibility for determining relative sensitivity fac tors improves significantly for cesium clusters.