A. Adriaens et al., QUANTIFICATION OF IMPURITIES IN BRASS USING SECONDARY-ION MASS-SPECTROMETRY - A COMPARISON OF MATRIX EFFECTS FOR CSM(+) CLUSTERS AND M(+) IONS, International journal of mass spectrometry and ion processes, 151(1), 1995, pp. 63-68
Citations number
10
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
This study discusses the influence of matrix effects on relative sensi
tivity factors in secondary ion mass spectrometry for a quantification
study of major and impurity elements in standard brass reference mate
rials. A comparison has been made between relative sensitivity factors
, which are obtained through acquisition of CsM(+) clusters under cesi
um bombardment and of M(+) ions under oxygen bombardment. The data of
the present study suggest that the matrix effects have been reduced in
the case of cesium clusters, but nevertheless remain significant. In
addition, the reproducibility for determining relative sensitivity fac
tors improves significantly for cesium clusters.