K. Kobayashi et al., PREPARATION OF C-AXIS ORIENTED ZNO FILMS BY LOW-PRESSURE ORGANOMETALLIC CHEMICAL-VAPOR-DEPOSITION, Thin solid films, 266(2), 1995, pp. 106-109
ZnO films have been deposited on sapphire (0001) substrates at 370 deg
rees C at a H2O partial pressure of 2.7 X 10(-2) to 2.7 X 10(-3) Pa, u
sing zinc acetate as a precursor. All of the resultant ZnO films are i
nsulators at room temperature. ZnO film with a smooth surface has been
prepared at a H2O partial pressure of 6.7 X 10(-3) Pa, and its X-ray
diffraction pattern is not affected by annealing at 500 degrees C for
10 h in air. In photoluminescence spectra at 77 K, an intense broad ba
nd is observed in near-UV region (3.3-3.4 eV) for as-deposited ZnO fil
ms, whereas the emission in the near-UV region is significantly dimini
shed by the annealing.