MINORITY-CARRIER LIFETIME IN THIN-FILMS OF ZN3P2 USING MICROWAVE AND OPTICAL TRANSIENT MEASUREMENTS

The transient nature of optical absorbance and the microwave cavity pe rturbation technique are used to measure the minority carrier lifetime in a polycrystalline thin film of Zn3P2 as well as to observe the spe ctral photoabsorbance. It has been observed that the transient decay c urves consist of two components attributed to the surface carriers and the bulk carriers. The analysis of these spectral variation of carrie r lifetime and spectral photoabsorbance indicate the possible band-ban d transitions in this material.