S. Kim et S. Baik, DEPOSITION AND CHARACTERIZATION OF PBTIO3 THIN-FILMS GROWN BY RADIO-FREQUENCY SPUTTERING ON MGO(100), Thin solid films, 266(2), 1995, pp. 205-211
A series of experiments for growing epitaxial PbTiO3 thin films have b
een made with radio frequency (r.f.) magnetron sputtering. The effects
of various sputtering parameters such as substrate temperature, r.f.
input power, gas composition, gas pressure and deposition rate on the
chemical and structural characteristics of PbTiO3 thin films were inve
stigated. Highly c-axis oriented epitaxial ferroelectric PbTiO3 thin f
ilms have been obtained under optimum sputtering conditions. The activ
ation energy for the epitaxy formation was observed to be about 0.92 e
V. The crystallinity of the epitaxial films was evaluated using rockin
g curve measurement as well as Rutherford backscattering spectrometry
channeling measurement. The cross-sectional transmission electron micr
oscopy study revealed that the c-axis oriented epitaxial film had 90 d
egrees domain structures. The epitaxial relationship of the film was P
bTiO3(001)//MgO(001) and PbTiO3[100]//MgO[100] in the c-axis oriented
domain, its surface microstructure was highly mosaic. A good transpare
ncy in the region above 400 nm to infrared, and a remanent polarizatio
n of 34 mu C cm(-2) and a coercive field of 97 kV cm(-1) were obtained
.