SIMULATION OF THE VAPORIZATION PROCESS IN INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY WITH A MODIFIED-MODEL USING THE MONTE-CARLO TECHNIQUE
Yp. Hu et al., SIMULATION OF THE VAPORIZATION PROCESS IN INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY WITH A MODIFIED-MODEL USING THE MONTE-CARLO TECHNIQUE, Journal of analytical atomic spectrometry, 9(3), 1994, pp. 213-216
An improved Monte Carlo program based on the velocity model and two-te
mperature model for the simulation of the aerosol vaporization process
in an inductively coupled plasma (ICP) is presented. The influence of
carrier gas flow rate, Q(g), on the useful mass transport rate, W(u),
and the influence of Q(g) on W(u) at a given observation height above
the load coil are studied. The variation of the evaporated and unevap
orated droplet numbers with Q(g) at a known observation height in the
axial channel of the ICP is also presented. The results confirm experi
mental observations that carrier gas flow rate and observation height
are the critical parameters in controlling W(u) and hence, in large pa
rt, the observed emission signal. As expected, the quality of the aero
sol input is also shown to be an important factor.