CuInSe2 (CIS) films with Cu/In ratios (gamma) ranging from 0.81 to 1.8
1 have been grown by molecular beam epitaxy on (001)-oriented GaAs sub
strates at a substrate temperature of T(s) = 450-degrees-C. It is foun
d that Cu-rich films tend to become Se-poor, and In-rich films tend to
become Se-rich. X-ray diffraction patterns obtained from these films
have shown the peaks with respect to CIS {n00} planes, clearly indicat
ing epitaxial growth. Optical properties of the CIS films have been ch
aracterized by means of photoluminescence (PL) spectroscopy at 2 K. Ma
ny distinct emission lines including a band edge emission were present
on PL spectra obtained from Cu-rich films. A broad emission (lambda a
pproximately 1.45 mum) appeared at gamma = 1.04, then became dominant
with further decreasing gamma.