Sp. Frigo et al., THE SOFT-X-RAY PHOTOCHEMISTRY OF PHYSISORBED SIF4 .1. REACTIONS OF THE MOLECULAR-SPECIES THROUGH DESORPTION AND DISSOCIATION, The Journal of chemical physics, 103(23), 1995, pp. 10356-10365
We present evidence that demonstrates photolysis of SiF4 adsorbed on G
e(100) at 30 K. Silicon 2p soft x-ray photoemission spectroscopy (PES)
indicates that upon irradiation, the molecularly adsorbed SiF4 dissoc
iates into SiFn species (where n = 0,1,2,3) and desorbs as molecular S
iF4. Also, the Si 2p PES from undissociated molecules exhibits a numbe
r of distinct kinetic-energy shifts. These are attributed to anisotrop
ic adsorption in which different molecular sites have different appare
nt Si 2p binding energies. A structure of the adsorbate layer is propo
sed to account for the varying core hole screening. Examination of the
gas phase during irradiation confirms molecular desorption and shows
the system to have a significant neutral molecular desorption yield. C
hanges in the valence-level photoemission structure and signal intensi
ty are consistent with the observed fragmentation and desorption, both
of which lead to disappearance of the molecularly adsorbed species. (
C) 1995 American Institute of Physics.