S. Chichibu et al., 2.51 EV DONOR-ACCEPTOR PAIR PHOTOLUMINESCENCE FROM ZN-DOPED CUALSE2 EPILAYER GROWN BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION, JPN J A P 1, 32, 1993, pp. 531-533
A donor to acceptor pair photoluminescence (PL) peak at 2.51 eV was ob
served in Zn-doped CuAlSe2 epilayers grown by low-pressure metalorgani
c chemical vapor deposition. The summation of ionization energies of t
he donor and the acceptor was obtained to be 330 meV from the excitati
on intensity dependence of the PL peak energy. The Zn impurity is show
n to act as a defect-killer because of the apperance of exciton emissi
on at 2.716 eV.