MICROMAGNETICS OF SOFT-MAGNETIC THIN-FILMS IN PRESENCE OF DEFECTS

Citation
T. Komine et al., MICROMAGNETICS OF SOFT-MAGNETIC THIN-FILMS IN PRESENCE OF DEFECTS, Journal of applied physics, 78(12), 1995, pp. 7220-7225
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
12
Year of publication
1995
Pages
7220 - 7225
Database
ISI
SICI code
0021-8979(1995)78:12<7220:MOSTIP>2.0.ZU;2-K
Abstract
We solve numerically the Landau-Lifshitz-Gilbert equation and calculat e the magnetization in a magnetic film including a nonmagnetic defect for two initial magnetization slates consisting of circular structure with 4 domains and 7 domains. The defect at the vortex wall restrains the magnetization temporarily but the vortex wall comes out of the def ect beyond a critical applied field. This critical field increases as the defect size becomes large. The defect at the film side fixes the m agnetization at the film edge. The edge defect leads to a reproducible magnetization state inside the film, though a locally stable structur e appears for the magnetic thin film without defects. It seems that th e defect may improve the stability of the magnetic thin film head. (C) 1995 American Institute of Physics.