FIRST PRINCIPLES SIMULATIONS OF SILICON NANOINDENTATION

Citation
R. Perez et al., FIRST PRINCIPLES SIMULATIONS OF SILICON NANOINDENTATION, Physical review letters, 75(26), 1995, pp. 4748-4751
Citations number
16
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
75
Issue
26
Year of publication
1995
Pages
4748 - 4751
Database
ISI
SICI code
0031-9007(1995)75:26<4748:FPSOSN>2.0.ZU;2-6
Abstract
Total-Energy pseudopotential calculations are used to study the onset and development of plasticity in nanoindentation experiments. Plastic flow of atoms towards interstitial positions and extrusion of material towards the tip walls, stabilized by the adhesive interactions with t he tip, are the dominant mechanisms. The delocalization of the charge induced by the stress in the elastically compressed structure triggers these plastic deformations. The onset of irreversible damage is relat ed to the plastic deformation of the secund double layer of the Si(111 ) surface.