IMPROVED KELVIN METHOD FOR MEASURING CONTACT POTENTIAL DIFFERENCES BETWEEN STEPPED GOLD SURFACES IN ULTRAHIGH-VACUUM

Citation
Jp. Bellier et al., IMPROVED KELVIN METHOD FOR MEASURING CONTACT POTENTIAL DIFFERENCES BETWEEN STEPPED GOLD SURFACES IN ULTRAHIGH-VACUUM, Review of scientific instruments, 66(12), 1995, pp. 5544-5547
Citations number
10
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
66
Issue
12
Year of publication
1995
Pages
5544 - 5547
Database
ISI
SICI code
0034-6748(1995)66:12<5544:IKMFMC>2.0.ZU;2-E
Abstract
A new mechanical system and a convenient piezoelectric driven Kelvin p robe for the measurement of the contact potential difference (CPD) und er ultrahigh vacuum are described. Charging effects on CPD measures ar e discussed. The probe is small (2.2 mm diam) and allows cartography o f the surface. The mechanical system is frictionless so the distance b etween the sample and the probe can be maintained constant and at a lo w value (approximate to 20 mu m). By elimination of charging effects, reliable and reproducible results can be obtained within +/-10 mV. The system is tested on gold vicinal surfaces. (C) 1995 American Institut e of Physics.