Jp. Bellier et al., IMPROVED KELVIN METHOD FOR MEASURING CONTACT POTENTIAL DIFFERENCES BETWEEN STEPPED GOLD SURFACES IN ULTRAHIGH-VACUUM, Review of scientific instruments, 66(12), 1995, pp. 5544-5547
A new mechanical system and a convenient piezoelectric driven Kelvin p
robe for the measurement of the contact potential difference (CPD) und
er ultrahigh vacuum are described. Charging effects on CPD measures ar
e discussed. The probe is small (2.2 mm diam) and allows cartography o
f the surface. The mechanical system is frictionless so the distance b
etween the sample and the probe can be maintained constant and at a lo
w value (approximate to 20 mu m). By elimination of charging effects,
reliable and reproducible results can be obtained within +/-10 mV. The
system is tested on gold vicinal surfaces. (C) 1995 American Institut
e of Physics.