STRUCTURAL-PROPERTIES OF CUBIC MNTE LAYERS GROWN BY MBE

We report on the growth of zinc-blende MnTe on (001) GaAs substrates b y MBE. Layers with thickness up to 8 mu m were grown. The growth was p erformed for various ratios of Mn acid Te fluxes. For high values of t he Te/Mn Bur ratio, Raman scattering spectra showed a presence of tell urium lines corresponding to crystalline tellurium. For low flux ratio s the presence of Te precipitates was less evident. These results were confirmed by X-ray diffraction studies. The lattice parameter of cubi c MnTe and its temperature dependence were determined by X-ray diffrac tion. From the analysis of the rocking curves, for various Bragg refle ctions, the fluctuations of the lattice parameter and mosaicity were s eparated out.