IMPROVED ATOMIC-FORCE MICROSCOPY IMAGING USING CARBON-COATED PROBE TIPS

Authors
DORIS BB HEGDE RI
Citation
Bb. Doris et Ri. Hegde, IMPROVED ATOMIC-FORCE MICROSCOPY IMAGING USING CARBON-COATED PROBE TIPS, Applied physics letters, 67(25), 1995, pp. 3816-3818
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
67
Issue
25
Year of publication
1995
Pages
3816 - 3818
Database
ISI
SICI code
0003-6951(1995)67:25<3816:IAMIUC>2.0.ZU;2-Y
Abstract
Atomic force microscopy (AFM) images using carbon-coated probe tips ar e presented for hydrogen-passivated Si and SiO2 surfaces. Tapping mode measurements on these surfaces demonstrate that the image quality and probe tip wear characteristics are dramatically improved for scans pe rformed with the carbon coated tips. The reasons for the improved qual ity of AFM imaging and reduced tip damage are discussed. (C) 1995 Amer ican Institute of Physics.