Yh. Li et al., EFFECTS OF 50 KEV H-2(-ION IMPLANTATION AND RAPID THERMAL ANNEALING ON THE MICROSTRUCTURE OF YBCO THIN-FILMS()), Journal of Materials Science, 30(23), 1995, pp. 5927-5930
A YBCO film with thickness of about 200 nm was deposited on LaAlO3 [10
0] by direct current (d.c.) sputtering. The film, which was found to b
e mainly c-axis orientated, was irradiated at room temperature with 50
keV H-2(+) ions to a dose of 1 x 10(16) cm(-2). This implantation des
troyed the superconductivity and made the film textured, with the ''ep
itaxial'' crystalline structure of the film being mainly maintained. T
ransmission electron microscope studies show that there are a consider
able number of amorphous islands, which are Y rich and Cu poor compare
d with the 123 phase in the as-received YBCO film. These amorphous isl
ands are found to be unstable under the irradiation, as after implanta
tion some polycrystalline regions, rather than amorphous islands, can
be seen by TEM. Rapid thermal annealing in flowing O-2 ambient can ind
uce oxygen reordering and results in partial recovery of critical temp
erature, T-c. After RTA, the polycrystalline regions have not changed.