SECONDARY-ION MASS-SPECTROMETRIC STUDIES ON THE FORMATION MECHANISM OF IRO2 TIO2-BASED COATINGS/

The formation mechanism of an IrO2/TiO2 film electrode has been studie d by secondary ion mass spectrometry (SIMS). A coating mixture with th e composition 50% Ir+50% Ti prepared on a titanium support from an iso propanolic solution of hydrated iridium chloride and titanium bis-2,4- pentanedionate precursors was heated to specified temperatures and ana lysed by SIMS. Concentration depth profiles of some selected species ( e.g. Cl-, O-, ClO-, TiO+, Ir+, IrO2-, TiO2-, CHn-, C2Hn-, OH-) were us ed to follow the process of film evolution. Segregation phenomena resu lting in the increased dispersity of the noble metal on the surface we re identified. The results are in accordance with-and complementary to -those of former measurements by combined thermoanalytical, mass spect rometric and emission Fourier transform infrared (FTIR) techniques.