P. Nowak et al., ADDITION OF A SINGLE CHEMICAL FUNCTIONAL-GROUP TO A POLYMER SURFACE WITH A MASS-SEPARATED LOW-ENERGY ION-BEAM, Surface and interface analysis, 23(13), 1995, pp. 873-878
A mass-separated low-energy ion beam system was used to deliver pure O
H+ and NH+ to 15 nm thick polystyrene films on silicon in ultrahigh va
cuum. This was done in an effort to produce specific surface chemical
functional groups, X-ray photoelectron spectroscopy showed that when t
he bombardment energy of OH+ exceeded 10 eV, or the dose was higher th
an 1 x 10(16) ions cm(-2), a mixture of C-OH, C-C=O and C-COOH groups
was produced, along with severe damage to the aromatic rings. However,
for bombardment at 10 eV with a dose of 1 x 10(16) ions cm(-2), only
C-OH (or COR) groups were found, Similarly, bombardment with NH+ at 10
eV and a dose 1 x 10(16) ions cm(-2) induced incorporation of a singl
e nitrogen-containing functionality, The C 1s data indicated that the
major chemical functionality on such surfaces in a C-NH2 (or C-NHR) gr
oup with a minor component of C-(NH2)(2). Hence, surface functionality
can indeed be controlled by altering the molecular nature, energy and
dose of the bombarding species.