APPLICATION OF GIBBS ENERGY MINIMIZATION TECHNIQUE FOR THE DETERMINATION OF CONCENTRATION OF POINT-DEFECTS AND CHARGE-CARRIERS IN GAAS EPITAXIAL LAYERS

Citation
Lm. Pavlova et Vm. Glazov, APPLICATION OF GIBBS ENERGY MINIMIZATION TECHNIQUE FOR THE DETERMINATION OF CONCENTRATION OF POINT-DEFECTS AND CHARGE-CARRIERS IN GAAS EPITAXIAL LAYERS, Zurnal fiziceskoj himii, 68(3), 1994, pp. 427-432
Citations number
26
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00444537
Volume
68
Issue
3
Year of publication
1994
Pages
427 - 432
Database
ISI
SICI code
0044-4537(1994)68:3<427:AOGEMT>2.0.ZU;2-5