APPLICATION OF GIBBS ENERGY MINIMIZATION TECHNIQUE FOR THE DETERMINATION OF CONCENTRATION OF POINT-DEFECTS AND CHARGE-CARRIERS IN GAAS EPITAXIAL LAYERS
Lm. Pavlova et Vm. Glazov, APPLICATION OF GIBBS ENERGY MINIMIZATION TECHNIQUE FOR THE DETERMINATION OF CONCENTRATION OF POINT-DEFECTS AND CHARGE-CARRIERS IN GAAS EPITAXIAL LAYERS, Zurnal fiziceskoj himii, 68(3), 1994, pp. 427-432