D. Maierschneider et al., A NEW ANALYTICAL SOLUTION FOR THE LOAD-DEFLECTION OF SQUARE MEMBRANES, Journal of microelectromechanical systems, 4(4), 1995, pp. 238-241
Accurate models are essential for the determination of the elastic pro
perties of thin films from load-deflection experiments, Although finit
e element method (FEM) models have the potential to be very accurate,
analytical models are desirable because of their simplicity, In this p
aper we present a new analytical solution for the load-deflection of m
embranes, Our solution yields the same relationship between the load a
nd the deflection as the known analytical solution, However, the value
s of two constants are up to 35% higher and correspond well with the r
esults from FEM analysis, In addition, the new solution yields analyti
cal forms of the bending lines, which agree well with experimental mea
surements carried out with silicon nitride membranes, [136]