Cy. Poon et B. Bhushan, COMPARISON OF SURFACE-ROUGHNESS MEASUREMENTS BY STYLUS PROFILER, AFM AND NONCONTACT OPTICAL PROFILER, Wear, 190(1), 1995, pp. 76-88
Surface roughness measurements were performed on a glass-ceramic disk
substrate by stylus profiler (SP), atomic force microscope (AFM) and n
on-contact optical profiler (NOP). Results of surface measurements are
presented and the differences between SP, AFM and NOP roughness measu
rements are discussed. The effects of stylus size, scan size and sampl
ing interval on roughness parameters are investigated. The methodology
of choosing the scan size and sampling interval is suggested. AFM is
concluded to be the most suitable surface measuring instrument for rou
ghness measurement on the glass-ceramic substrate. If SP is used to ma
ke the measurement, the tip radius should be in the order of 0.2 mu m.
However, localized damage to the test surface may occur owing to high
contact stress. NOP using an objective magnification of 40 or lower i
s not recommended because the glass-ceramic substrate contains submicr
on roughness.