Destructive study of nickel/cadmium cells is generally a preferred met
hod of measuring cell degradation. The voltage recovery of these cells
at a low state-of-charge has been in use as an acceptance test, even
though efforts to correlate the cell voltage to degradation mechanisms
have not been successful. In this study, the shape of the cell voltag
e recovery curve is correlated with the capacity-limiting electrode. I
t is shown that voltage recovery can give useful information of soft s
horts in nickel/cadmium cells.