Scanning Force Microscope images of silicon surface morphology are pre
sented for samples exposed to various oxidizing environments followed
by oxide removal. These are contrasted with samples exposed to HNO3/HF
solutions. The former samples consistently produced surface roughness
on the order of a few nanometers, while the latter solution exhibited
surface roughness of several hundred to over a thousand nanometers. T
his cough surface is photoluminescent and is known as porous silicon.
Careful observation of the onset of the reaction (which is preceeded b
y a concentration dependent induction period) suggests that the reacti
on mechanism is autocatalytic; some etchant product species catalyzes
the further attack of the surface. Surface features of co-existing flu
orescing and non-fluorescing regions emphasize the heavy etching prese
nt in the porous silicon region. Local control of the porous silicon f
ormation by a photoinduced etching process is reported for the first t
ime suggesting the possibility of a non-resist lithographic procedure.