Using scanning electron microscopy combined with electron microprobe a
nalysis, changes in the microstructure of iron, cobalt, and nickel sil
icides of various compositions, after etching in 1 N H2SO4 that contai
ns 50 - 100 mM of NaF were investigated. It is shown that corrosive F-
ions attack a SiO2 protective film, which results in local Si dissolu
tion in the superficial layers of intermetallic compounds. The resista
nce of the silicides to H2SO4 increases with Si content (Me(2)Si < MeS
i < MeSi(2)) and is also dependent on the metal type.