C. Ito et al., HIGH-TEMPERATURE MICROWAVE CHARACTERISTICS OF GAAS-MESFET DEVICES WITH ALAS BUFFER LAYERS, IEEE electron device letters, 17(1), 1996, pp. 16-18
AlAs buffers used to reduce the leakage current of high-temperature Ga
As MESFET devices are shown to have no detrimental effect on the micro
wave performance measured to 200 degrees C. The f(t) values decrease w
ith increasing temperature, but do not appear to be influenced by the
AlAs buffer. The f(max) values also decrease with increasing temperatu
re; however, they are improved with increasing AlAs buffer thickness d
ue to a concomitant decrease in the device output conductance. At 200
degrees C ambient temperature, f(t) and f(max) values of 14.5 GHz and
36.7 GHz, respectively, were measured.