HIGH-TEMPERATURE MICROWAVE CHARACTERISTICS OF GAAS-MESFET DEVICES WITH ALAS BUFFER LAYERS

Citation
C. Ito et al., HIGH-TEMPERATURE MICROWAVE CHARACTERISTICS OF GAAS-MESFET DEVICES WITH ALAS BUFFER LAYERS, IEEE electron device letters, 17(1), 1996, pp. 16-18
Citations number
17
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
07413106
Volume
17
Issue
1
Year of publication
1996
Pages
16 - 18
Database
ISI
SICI code
0741-3106(1996)17:1<16:HMCOGD>2.0.ZU;2-E
Abstract
AlAs buffers used to reduce the leakage current of high-temperature Ga As MESFET devices are shown to have no detrimental effect on the micro wave performance measured to 200 degrees C. The f(t) values decrease w ith increasing temperature, but do not appear to be influenced by the AlAs buffer. The f(max) values also decrease with increasing temperatu re; however, they are improved with increasing AlAs buffer thickness d ue to a concomitant decrease in the device output conductance. At 200 degrees C ambient temperature, f(t) and f(max) values of 14.5 GHz and 36.7 GHz, respectively, were measured.