HETEROEPITAXIAL GROWTH OF NICKEL ON DIAMOND

Authors
Citation
H. Bialas et J. Niess, HETEROEPITAXIAL GROWTH OF NICKEL ON DIAMOND, Thin solid films, 268(1-2), 1995, pp. 35-38
Citations number
11
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
268
Issue
1-2
Year of publication
1995
Pages
35 - 38
Database
ISI
SICI code
0040-6090(1995)268:1-2<35:HGONOD>2.0.ZU;2-E
Abstract
Nickel films have been grown on synthetic type Ib diamonds. The films prepared under ultra high vacuum conditions by electron-beam evaporati on were characterized by X-ray diffraction, reflection high-energy ele ctron diffraction, low-energy electron diffraction, scanning electron microscopy, Nomarski microscope and Talystep profilometer. Epitaxial g rowth was found even at a 25 degrees C substrate temperature, in contr ast to the literature (R.J. Caveney et al., Diamond Research, Industri al Diamond Information Bureau, London, 1971, p. 20) where an epitaxy t emperature of 205 degrees C is reported. Below 300 degrees C the films grow in a two-dimensional mode.