INFRARED REFLECTION STUDY OF CUO IN THIN OXIDE-FILMS

Cupric oxide in thin film form is studied by infrared reflectance spec troscopy and is characterised by absorption bands at 480 and 540 cm(-1 )(associated with transverse optical vibration modes) and at 600 cm(-1 ) (associated with longitudinal optical vibration mode). The modelisat ion of reflection spectra obtained when CuO oxide is present under dif ferent morphologies (inclusion, aggregate or outer layer of a multilay er system) predicts a shift of the band at 480 cm(-1) to 520 cm(-1). T he experimental spectra obtained by copper oxidation confirm this tren d and the influence of oxide film structure on the details of the spec tra. Thus, infrared reflection spectroscopy is an appropriate method f or the study and the understanding of complex structures such those de veloped during the oxidation of copper-nickel alloys.