G. Baravian et al., OPTICAL-EMISSION SPECTROSCOPY OF ACTIVE SPECIES IN A TICN PVD ARE DISCHARGE, Surface & coatings technology, 77(1-3), 1995, pp. 687-693
In this article, it is shown that a good correlation is obtained betwe
en optical emission spectroscopy (OES) measurements of the plasma ligh
t and the electron spectroscopy for chemical analysis (ESCA) of the Ti
CN coating of a steel wafer in a physical vapor deposition (PVD) are d
ischarge reactor. The reactor works in a N-2-CH4 mixture, at a total p
ressure of about 10(-2) mbar, and the plasma is created from a cathodi
c titanium are with an evaporation voltage of 20 V and current intensi
ty of 60 A. The TiCN deposition takes place at 20 cm from the are disc
harge. The study performs the measurement of the relative intensities,
spatially resolved, of the N-2(+) line at 427.5 nm, the Ti lines at 4
30.1 nm and 430.5 nm and the CH line at 431.4 nm as a function of the
respective concentrations of the methane-nitrogen mixture. The ratio o
f the intensities of the plasma lines CH and N-2(+) is quasi-linearly
related to the ratio of the concentrations C and N measured by ESCA on
the coating. On the basis of the results obtained we are developing O
ES as non-intrusive and in situ diagnostic of the plasma reactive spec
ies for controlling the TiCN deposition process in an industrial react
or.