We describe an experimental method for obtaining a direct measurement
of the lifetime tau(d) of the zero-voltage state in Josephson junction
s operating at temperatures around 1 K (thermal regime). The range of
tau(d) covered by this method runs typically from 10(-3) to 10(-6) sec
. The comparison of the experimental results with the theoretical pred
ictions is also a test of the effective temperature of the junction. T
he possibility of extending the procedure for the determination of oth
er time-scales, such as those involved in quantum-Zeno effect and trav
ersal time, are discussed.